This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83
Figure 1: CL KPFM measurements over an Au/Si/Al trench: (a) topography; (b) optical view of the AFM probe dur...
Figure 2: Consecutive taps performed during OP AM-KPFM operated on top of the PFT mode. The bias modulation (...
Figure 3: The AFM deflection response to three sinusoidal pulses of bias modulation during the out-of-contact...
Figure 4: Average and standard deviation values of CPD determined from parabolic bias dependence and time ser...
Figure 5: Comparison of CPD traces from OP AM-KPFM, CL AM-KPFM, and CL FM-KPFM in both measurement configurat...
Figure 6: Separation of the average contributions of the tip and cantilever to the measured OL AM-KPFM signal...
Figure 7: Maps from OL AM-KPFM operated in PFT mode over an Al/Si/Au trench: (a) topography extracted from th...
Figure 8: Histograms of the OL AM-KPFM measurements over the Al and Au regions: (a) The measurements were mad...